Interactive Demo

This demonstration page allows you to test out the Web Services API by sending a request and viewing the JSON data returned. See the Reference Manual for a complete guide to the available services.

Request

https://api-v2.onetcenter.org/
GET parameters
? =
& =
& =
& =
& =
& =
& =
& =
& =
& =

Response

Send a request to see the response.
Loading...
The request could not be completed (). Please try again.
URL:
https://api-v2.onetcenter.org/online/occupations/19-2032.00/details/tools_used
Status:
200 OK
Content-Type:
application/json
{
   "start": 1,
   "end": 10,
   "total": 93,
   "next": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/details/tools_used?start=11&end=20",
   "category": [
      {
         "code": 41115403,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41115403",
         "title": "Spectrometers",
         "example": [
            "Dielectric spectrometers",
            "Gamma ray spectrometers",
            "Mossbauer spectroscopes",
            "Secondary ion mass spectrometers SIMS"
         ],
         "example_more": [
            "Auger electron spectrometers",
            "Raman scattering spectroscopes"
         ]
      },
      {
         "code": 41104601,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41104601",
         "title": "Laboratory box furnaces",
         "example": [
            "Box furnaces",
            "Muffle furnaces",
            "Nitrogen furnaces",
            "Ultra high temperature furnaces"
         ],
         "example_more": [
            "Electrode furnaces"
         ]
      },
      {
         "code": 41111724,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41111724",
         "title": "Scanning probe microscopes",
         "example": [
            "Atomic force microscopes",
            "Nanoscope atomic force microscopes",
            "Scanning Kelvin probes",
            "Scanning tunneling microscopes STM"
         ],
         "example_more": [
            "Scanning probe microscopes SPM"
         ]
      },
      {
         "code": 41114601,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41114601",
         "title": "Abrasion testers",
         "example": [
            "Erosion testers",
            "Scratch testers",
            "Slurry abrasion testers"
         ]
      },
      {
         "code": 41111502,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41111502",
         "title": "Laboratory balances",
         "example": [
            "Quartz crystal microbalances",
            "Semi-microbalances",
            "Ultra microbalances"
         ]
      },
      {
         "code": 41103312,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41103312",
         "title": "Viscosimeters",
         "example": [
            "Cone viscometers",
            "Plate viscometers",
            "Rotational viscometers"
         ]
      },
      {
         "code": 41111623,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41111623",
         "title": "Thickness measuring devices",
         "example": [
            "Ellipsometers",
            "Imaging ellipsometers",
            "Quartz crystal thickness monitors"
         ]
      },
      {
         "code": 41114604,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41114604",
         "title": "Corrosion testers",
         "example": [
            "Multisample autoclaves",
            "Salt spray chambers",
            "Titanium autoclaves"
         ]
      },
      {
         "code": 41111720,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/41111720",
         "title": "Scanning electron microscopes",
         "example": [
            "Field emission scanning electron microscopes",
            "Scanning electron microscopes SEM"
         ]
      },
      {
         "code": 23211101,
         "related": "https://api-v2.onetcenter.org/online/occupations/19-2032.00/related/tools_used/23211101",
         "title": "Semiconductor process systems",
         "example": [
            "Reactive ion etchers RIE",
            "Sputter deposition systems"
         ]
      }
   ]
}