Interactive Demo

This demonstration page allows you to test out the Web Services API by sending a request and viewing the JSON data returned. See the Reference Manual for a complete guide to the available services.

Request

https://api-v2.onetcenter.org/
GET parameters
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Response

Send a request to see the response.
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URL:
https://api-v2.onetcenter.org/online/occupations/17-3026.01/details/tools_used
Status:
200 OK
Content-Type:
application/json
{
   "start": 1,
   "end": 10,
   "total": 51,
   "next": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/details/tools_used?start=11&end=20",
   "category": [
      {
         "code": 23211101,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/23211101",
         "title": "Semiconductor process systems",
         "example": [
            "Electron beam evaporators",
            "Vacuum contact printers",
            "Wafer substrate bonders",
            "Wire bonders"
         ],
         "example_more": [
            "Atomic layer deposition ALD systems",
            "Capacitively coupled plasma CCP reactors",
            "Contact aligners",
            "Contact printers",
            "Dielectric deposition tools",
            "Electron beam writers",
            "Extreme ultraviolet EUV systems",
            "Focused ion beam FIB etching tools",
            "Inductively coupled plasma reactive ion etchers ICP-RIE",
            "Ion implanters",
            "Ion mills",
            "Low pressure chemical vapor deposition LPCVD systems",
            "Magnetron plasma sputter reactors",
            "Mask aligners",
            "Mask writers",
            "Metal-organic chemical vapor deposition MOCVD systems",
            "Molecular beam epitaxy MBE systems",
            "Molecular vapor deposition MVD systems",
            "Nanoimprint lithography NIL systems",
            "Parallel plate reactive ion etchers RIE",
            "Photoresist dispensing systems",
            "Photoresist spin coaters",
            "Plasma enhanced chemical vapor deposition PECVD systems",
            "Plasma etchers",
            "Spin processors",
            "Sputter coaters"
         ]
      },
      {
         "code": 41115403,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41115403",
         "title": "Spectrometers",
         "example": [
            "Energy dispersive x-ray EDX spectroscopes",
            "Infrared spectroscopes",
            "Photoelectron spectroscopes",
            "Secondary ion mass spectrometers SIMS"
         ]
      },
      {
         "code": 41111724,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41111724",
         "title": "Scanning probe microscopes",
         "example": [
            "Atomic force microscopes AFM",
            "Scanning acoustic microscopes",
            "Scanning probe microscopes SPM",
            "Scanning tunneling microscopes STM"
         ]
      },
      {
         "code": 41111720,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41111720",
         "title": "Scanning electron microscopes",
         "example": [
            "Field emission scanning electron microscopes FESEM",
            "Focused ion beam scanning electron microscopes FIB-SEM",
            "Scanning electron microscopes SEM"
         ]
      },
      {
         "code": 41112406,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41112406",
         "title": "Vacuum gauges",
         "example": [
            "Ion gauges",
            "Ionization gauges",
            "Pirani gauges"
         ]
      },
      {
         "code": 41113706,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41113706",
         "title": "Semiconductor testers",
         "example": [
            "Linewidth measurement systems",
            "Optical thin film measurement systems",
            "Parametric analyzers"
         ]
      },
      {
         "code": 41111709,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41111709",
         "title": "Binocular light compound microscopes",
         "example": [
            "Fluorescence optical microscopes",
            "Optical compound microscopes",
            "Optical profilers"
         ]
      },
      {
         "code": 46181501,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/46181501",
         "title": "Protective aprons",
         "example": [
            "Chemical aprons",
            "Chemical protective aprons"
         ]
      },
      {
         "code": 41111623,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/41111623",
         "title": "Thickness measuring devices",
         "example": [
            "Ellipsometers",
            "Spectroscopic ellipsometers"
         ]
      },
      {
         "code": 46181504,
         "related": "https://api-v2.onetcenter.org/online/occupations/17-3026.01/related/tools_used/46181504",
         "title": "Protective gloves",
         "example": [
            "Cryogenic gloves",
            "Gowning gloves"
         ]
      }
   ]
}